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    Aging Analysis and Degradation Prediction of PLL Circuits in 14-nm FinFET Technology

    Aging Analysis and Degradation Prediction of PLL Circuits in 14-nm FinFET Technology by Meng Li, Xin Xu, Xianghui Li, Yunpeng Li, Yiqun Shi, Qingqing Sun, Hao Zhu

    Published 2025-01-01
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