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    A Comparative Study of Supervised and Self-Supervised Denoising Techniques for Defect Segmentation in Industrial CT Imaging

    A Comparative Study of Supervised and Self-Supervised Denoising Techniques for Defect Segmentation in Industrial CT Imaging by Virginia Florian, Jiayang Shi, Willem Jan Palestijn, Daniël M. Pelt, K. Joost Batenburg, Thomas Lang, Christoph Heinzl, Christian Kretzer, Stefan Kasperl, Dominik Wolfschläger, Robert H. Schmitt

    Published 2025-02-01
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