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    A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing

    A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing by Wenfa Zhan, Yangxinzi Zhou, Jiangyun Zheng, Xueyuan Cai, Qingping Zhang, Xiaoqing Wen

    Published 2025-02-01
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