Integration of Arc and Microstructural Analysis for Anomaly Detection in Walls Manufactured by GMA-Based WAAM by Lucas J. E. B. Santos, Joyce I. V. Souto, Igo J. S. Azevedo, Walman B. Castro, Jefferson S. Lima, João M. P. Q. Delgado, Renato A. C. Santana, Ricardo S. Gomez, André L. D. Bezerra, Antonio G. B. Lima

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