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On the Reliability of Accelerated Testing in AIGaAs/InGaAs/GaAs PHEMTs by K. F. Yarn, W. C. Chien, C. S. Wang
Published 2002-01-01
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2
Direct Growth of High-Quality InP Layers on GaAs Substrates by MOCVD by K. F. Yarn, W. C. Chien, C. L. Lin, C. I. Liao
Published 2003-01-01
Article