Computational methods in nanometrology: the challenges of resolution and stochasticity by Alex Kondi, Alex Kondi, Efi-Maria Papia, Efi-Maria Papia, Eleni Stai, Eleni Stai, Vassilios Constantoudis, Vassilios Constantoudis

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Quantifying the Complexity of Rough Surfaces Using Multiscale Entropy: The Critical Role of Binning in Controlling Amplitude Effects by Alex Kondi, Vassilios Constantoudis, Panagiotis Sarkiris, Evangelos Gogolides

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Spatial Patterns in Fibrous Materials: A Metrological Framework for Pores and Junctions by Efi-Maria Papia, Vassilios Constantoudis, Youmin Hou, Prexa Shah, Michael Kappl, Evangelos Gogolides

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