M. Walker. Branching Is Not a Bug; It’s a Feature: Personal Identity and Legal (and Moral) Responsibility / trans. from Engl. V. A. Pilipenko by V. A. Pilipenko

Get full text

EFFECT OF RAPID THERMAL TREATMENT ТЕMPERATURE ON ELECTROPHYSICAL PROPERTIES OF NICKEL FILMS ON SILICON by Ja. A. Solovjov, V. A. Pilipenko

Get full text

EFFECT OF RAPID THERMAL TREATMENT CONDITIONS ON ELECTROPHYSICAL PROPERTIES OF CROMIUM THIN FILMS ON SILICON by J. A. Solovjov, V. A. Pilipenko

Get full text

Effect of Pulsed Photon Processing in Nitrogen Ambient on Optical and Electrophysical Characteristics of Silicon Dioxide Layers of Its Boundaries with Silicon by N. S. Kovalchuk, V. A. Pilipenko, Ja. A. Solovjov

Get full text

Rapid thermal treatment robotics unit for creation of electronic equipment devices by V. A. Saladukha, V. A. Pilipenko, V. P. Yakovlev

Get full text

Influence of the rapid thermal treatment of the gate dielectric on the parameters of integrated circuits of time devices by V. A. Saladukha, V. A. Pilipenko, V. A. Gorushko

Get full text

Rapid thermal treatment modes of the Рt-Si system for formation of platinum silicide by V. A. Solodukha, V. A. Pilipenko, V. A. Gorushko

Get full text

Simulation of silicon wafers heating during rapid thermal processing using “UBTO 1801” unit by J. A. Solovjov, V. A. Pilipenko, V. P. Yakovlev

Get full text

INFLUENCE OF TIME MODES OF THERMAL TREATMENT ON Pt-Si SYSTEM MICROSTRUCTURE by V. A. Saladukha, V. A. Pilipenko, F. F. Komarov, V. A. Gorushko

Get full text

The impact of formation modes of platinum silicide by the quick heat treatment on Schottky diodes parameters by V. A. Saladukha, V. A. Pilipenko, V. A. Gorushko, V. A. Philipenya

Get full text

Electron-microscope investigations of the Pt-Si system during its rapid thermal treatment by V. A. Saladukha, V. A. Pilipenko, F. F. Komarov, V. A. Gorushko

Get full text

Formation of a gate dielectric of nanometer thickness by rapid thermal treatment by N. S. Kovalchuk, A. A. Omelchenko, V. A. Pilipenko, V. A. Solodukha, D. V. Shestovski

Get full text

Formation OF ZINC OXIDE THIN FILMS BY COMBINED METHOD OF HYDROTHERMAL AND LAYERED ATOM DEPOSITION by E. B. Chubenko, V. P. Bondarenko, V. A. Pilipenko, K. .. Topalli, A. K. Okyay

Get full text

METHOD AND CONTROL SET-UP OF SILICON WAFER FLATNESS by V. A. Pilipenko, A. N. Petlitsky, V. A. Gorushko, S. V. Shvedov, V. V. Ponaryadov

Get full text

The Influence of Rapid Heat Treatment During the Formation of Aluminum-Polysilicon Contacts on the Electrical Parameters of CMOS Microcircuits by V. A. Pilipenko, N. S. Kovalchuk, Ja. A. Solovjov, D. V. Shestovski, D. V. Zhyhulin

Get full text

Reliability Express Control of the Gate Dielectric of Semiconductor Devices by V. A. Solodukha, G. G. Chigir, V. A. Pilipenko, V. A. Filipenya, V. A. Gorushko

Get full text

Thermal Load Influence during the Formation of Al-Al Contacts on the Electrical Parameters of the Integrated Circuits with Aluminum-Polysilicon Contacts by V. A. Pilipenko, V. A. Solodukha, N. S. Kovalchuk, J. A. Solovjov, D. V. Shestovski, D. V. Zhyhulin

Get full text

Formation OF NANOCOMPOSITE MATERIALS BASED ON POROUS SILICON AND ZINC OXIDE BY ELECTROCHEMICAL TECHNIQUE by A. I. Sherstnyov, E. B. Chubenko, S. V. Redko, V. A. Petrovich, V. A. Pilipenko, V. P. Bondarenko

Get full text

EQUIPMENT FOR NONDESTRUCTIVE TESTING OF SILICON WAFERS SUBMICRON TOPOLOGY DURING THE FABRICATION OF INTEGRATED CIRCUITS by S. A. Chizhik, S. P. Basalaev, V. A. Pilipenko, A. L. Khudoley, T. A. Kuznetsova, V. V. Chikunov, A. A. Suslov

Get full text

KELVIN PROBE SELF-CALIBRATION MODE FOR SEMICONDUCTOR WAFERS PROPERTIES MONITORING by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky

Get full text