Showing 1 - 6 results of 6 for search 'V. A. Lapitskaya', query time: 0.02s Refine Results
  1. 1
    Determination of Crack Resistance of the Cover and Slide Glass by Indentation Method with the Visualization Using Atomic Force Microscopy

    Determination of Crack Resistance of the Cover and Slide Glass by Indentation Method with the Visualization Using Atomic Force Microscopy by V. A. Lapitskaya, T. A. Kuznetsova, S. A. Chizhik

    Published 2024-04-01
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  2. 2
    Influence of Temperature from 20 to 100 °C on Specific Surface Energy and Fracture Toughness of Silicon Wafers

    Influence of Temperature from 20 to 100 °C on Specific Surface Energy and Fracture Toughness of Silicon Wafers by V. A. Lapitskaya, T. A. Kuznetsova, S. A. Chizhik

    Published 2023-12-01
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  3. 3
    Methods for Accuracy Increasing of Solid Brittle Materials Fracture Toughness Determining

    Methods for Accuracy Increasing of Solid Brittle Materials Fracture Toughness Determining by V. A. Lapitskaya, T. A. Kuznetsova, S. A. Chizhik, B. Warcholinski

    Published 2022-04-01
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  4. 4
    Local Correlation Metric for Assessing the Quality of Combined AFM Images

    Local Correlation Metric for Assessing the Quality of Combined AFM Images by M. Yu. Lavetski, V. Yu. Tsviatkou, A. A. Boriskevich, V. A. Lapitskaya, S. A. Chizhik

    Published 2023-06-01
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  5. 5
    Control of Tribological Characteristics of Wear-Resistant AlCrBN Coatings by Nanoscratch Testing

    Control of Tribological Characteristics of Wear-Resistant AlCrBN Coatings by Nanoscratch Testing by V. A. Lapitskaya, T. A. Kuznetsova, B. Warcholinski, A. V. Khabarova, T. V. Hamzeleva, A. Gilewicz, S. A. Chizhik

    Published 2025-07-01
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  6. 6
    Control of Integrated Circuits Crystals' Surface Microrelief and Defects of Heteroand Submicrostructures by the Atomic Force Microscopy Method

    Control of Integrated Circuits Crystals' Surface Microrelief and Defects of Heteroand Submicrostructures by the Atomic Force Microscopy Method by V. A. Lapitskaya, S. A. Chizhik, E. V. Lutsenko, J. A. Solovjov, A. A. Nasevich, K. S. Liutsko, T. V. Petlitskaya, V. B. Makarevich, Yu. Guangbin

    Published 2024-12-01
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