Showing 1 - 4 results of 4 for search 'U. A. Pilipenko', query time: 0.01s Refine Results
  1. 1
    Influence of rapid thermal treatment of the gate dielectric on the parameters of power field МОSFЕТ transistors

    Influence of rapid thermal treatment of the gate dielectric on the parameters of power field МОSFЕТ transistors by V. A. Solodukha, U. A. Pilipenko, V. A. Gorushko

    Published 2019-06-01
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  2. 2
    Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface after Exposure with Long-Term and Rapid Thermal Annealing

    Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface after Exposure with Long-Term and Rapid Thermal Annealing by U. A. Pilipenko, N. S. Kovalchuk, D. V. Shestovski, D. V. Zhyhulin

    Published 2024-07-01
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  3. 3
    Structure of Silicon Wafers Planar Surface before and after Rapid Thermal Treatment

    Structure of Silicon Wafers Planar Surface before and after Rapid Thermal Treatment by U. A. Pilipenko, A. A. Sergeichik, D. V. Shestovski, V. A. Solodukha

    Published 2024-07-01
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  4. 4
    Spectral Ellipsometry as a Method of Investigation of Influence of Rapid Thermal Processing of Silicon Wafers on their Optical Characteristics

    Spectral Ellipsometry as a Method of Investigation of Influence of Rapid Thermal Processing of Silicon Wafers on their Optical Characteristics by V. A. Solodukha, U. A. Pilipenko, A. A. Omelchenko, D. V. Shestovski

    Published 2022-10-01
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