DESIGN OF THE CONTACT POTENTIALS DIFFERENCE PROBES by K. U. Pantsialeyeu, U. A. Mikitsevich, A. L. Zharin

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Universal Digital Probe Electrometer for Testing Semiconductor Wafers by A. L. Zharin, U. A. Mikitsevich, A. I. Svistun, K. U. Pantsialeyeu

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Intelligent Sensor for Measurement Systems with Sinusoidal Excitation Response by U. A. Mikitsevich, A. I. Svistun, A. V. Samarina, K. U. Pantsialeyeu, A. L. Zharin

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Charge-Sensitive Technique for Deformation Processes’ Study by K. U. Pantsialeyeu, U. A. Mikitsevich, A. I. Svistun, R. I. Vorobey, O. K. Gusev, A. L. Zharin

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