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    Multi-frame blind deconvolution using X-ray microscope images of an in-plane rotating sample

    Multi-frame blind deconvolution using X-ray microscope images of an in-plane rotating sample by Shinnosuke Kurimoto, Takato Inoue, Hitoshi Aoto, Toshiki Ito, Satsuki Ito, Yoshiki Kohmura, Makina Yabashi, Satoshi Matsuyama

    Published 2024-11-01
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