Texture analysis of radiation sensitive organic films: Comparative study by electron diffraction tomography and GIWAXS by Kraus Irene, Wu Mingjian, Rechberger Stefanie, Will Johannes, Maiti Santanu, Kuhlmann Andreas, Huck Marten, Steinberger Marc, Brabec Christoph, Steinrück Hans-Georg, Unruh Tobias, Spiecker Erdmann

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