M. Walker. Branching Is Not a Bug; It’s a Feature: Personal Identity and Legal (and Moral) Responsibility / trans. from Engl. V. A. Pilipenko by V. A. Pilipenko

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EFFECT OF RAPID THERMAL TREATMENT ТЕMPERATURE ON ELECTROPHYSICAL PROPERTIES OF NICKEL FILMS ON SILICON by Ja. A. Solovjov, V. A. Pilipenko

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Interaction potential between two axially symmetric nuclei by V. Yu. Denisov, N. A. Pilipenko

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Fusion of deformed nuclei by V. Yu. Denisov, N. A. Pilipenko

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Capture cross sections for heavy-ion reactions producing compound system with Z = 12 by N. A. Pilipenko, V. Yu. Denisov

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EFFECT OF RAPID THERMAL TREATMENT CONDITIONS ON ELECTROPHYSICAL PROPERTIES OF CROMIUM THIN FILMS ON SILICON by J. A. Solovjov, V. A. Pilipenko

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Effect of Pulsed Photon Processing in Nitrogen Ambient on Optical and Electrophysical Characteristics of Silicon Dioxide Layers of Its Boundaries with Silicon by N. S. Kovalchuk, V. A. Pilipenko, Ja. A. Solovjov

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Rapid thermal treatment robotics unit for creation of electronic equipment devices by V. A. Saladukha, V. A. Pilipenko, V. P. Yakovlev

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Influence of rapid thermal treatment of the gate dielectric on the parameters of power field МОSFЕТ transistors by V. A. Solodukha, U. A. Pilipenko, V. A. Gorushko

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Influence of the rapid thermal treatment of the gate dielectric on the parameters of integrated circuits of time devices by V. A. Saladukha, V. A. Pilipenko, V. A. Gorushko

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Rapid thermal treatment modes of the Рt-Si system for formation of platinum silicide by V. A. Solodukha, V. A. Pilipenko, V. A. Gorushko

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Simulation of silicon wafers heating during rapid thermal processing using “UBTO 1801” unit by J. A. Solovjov, V. A. Pilipenko, V. P. Yakovlev

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Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface after Exposure with Long-Term and Rapid Thermal Annealing by U. A. Pilipenko, N. S. Kovalchuk, D. V. Shestovski, D. V. Zhyhulin

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INFLUENCE OF TIME MODES OF THERMAL TREATMENT ON Pt-Si SYSTEM MICROSTRUCTURE by V. A. Saladukha, V. A. Pilipenko, F. F. Komarov, V. A. Gorushko

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ON THE CORRELATION BETWEEN FEDERAL EDUCATIONAL STANDARDS AND PROFESSIONAL STANDARDS: PROBLEMS, POSSIBLE APPROACHES, RECOMMENDATION ON ACTUALIZATION by Sergey A. Pilipenko, Aleksandr A. Zhidkov, Evgeniya V. Karavaeva, Alexandra V. Serova

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Structure of Silicon Wafers Planar Surface before and after Rapid Thermal Treatment by U. A. Pilipenko, A. A. Sergeichik, D. V. Shestovski, V. A. Solodukha

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The impact of formation modes of platinum silicide by the quick heat treatment on Schottky diodes parameters by V. A. Saladukha, V. A. Pilipenko, V. A. Gorushko, V. A. Philipenya

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Spectral Ellipsometry as a Method of Investigation of Influence of Rapid Thermal Processing of Silicon Wafers on their Optical Characteristics by V. A. Solodukha, U. A. Pilipenko, A. A. Omelchenko, D. V. Shestovski

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Electron-microscope investigations of the Pt-Si system during its rapid thermal treatment by V. A. Saladukha, V. A. Pilipenko, F. F. Komarov, V. A. Gorushko

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Formation of a gate dielectric of nanometer thickness by rapid thermal treatment by N. S. Kovalchuk, A. A. Omelchenko, V. A. Pilipenko, V. A. Solodukha, D. V. Shestovski

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