Electrothermal Failure Physics of GaN Schottky Diodes Under High-Temperature Forward Biasing by Nahid Sultan Al-Mamun, Yuxin Du, Jianan Song, Rongming Chu, Aman Haque

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Field-dependent carrier transport in implanted isolation region of GaN lateral power devices by Mansura Sadek, Yixin Xiong, Yuxin Du, Jesse T. Kemmerling, Rian Guan, Jianan Song, Xingyu Liu, Xing Wang, Andy Xie, Rongming Chu

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