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  1. 1
    Deep learning driven silicon wafer defect segmentation and classification

    Deep learning driven silicon wafer defect segmentation and classification by Rohan Ingle, Aniket K. Shahade, Mayur Gaikwad, Shruti Patil

    Published 2025-06-01
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  2. 2
    Method for fetal ultrasound image classification using pseudo-labelling with PCA-KMeans and an attention-augmented MobileNet-LSTM model

    Method for fetal ultrasound image classification using pseudo-labelling with PCA-KMeans and an attention-augmented MobileNet-LSTM model by Aniket K. Shahade, Priyanka V. Deshmukh, Pritam H. Gohatre, Kanchan S. Tidke, Rohan Ingle

    Published 2025-12-01
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