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    Measuring error rates of mid-circuit measurements

    Measuring error rates of mid-circuit measurements by Daniel Hothem, Jordan Hines, Charles Baldwin, Dan Gresh, Robin Blume-Kohout, Timothy Proctor

    Published 2025-07-01
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  2. 2
    Practical Introduction to Benchmarking and Characterization of Quantum Computers

    Practical Introduction to Benchmarking and Characterization of Quantum Computers by Akel Hashim, Long B. Nguyen, Noah Goss, Brian Marinelli, Ravi K. Naik, Trevor Chistolini, Jordan Hines, J.P. Marceaux, Yosep Kim, Pranav Gokhale, Teague Tomesh, Senrui Chen, Liang Jiang, Samuele Ferracin, Kenneth Rudinger, Timothy Proctor, Kevin C. Young, Irfan Siddiqi, Robin Blume-Kohout

    Published 2025-08-01
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