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    Interface trap charges associated reliability analysis of Si/Ge heterojunction dopingless TFET

    Interface trap charges associated reliability analysis of Si/Ge heterojunction dopingless TFET by Suruchi Sharma, Rikmantra Basu, Baljit Kaur

    Published 2021-08-01
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    Impact of Temperature and Doping on the Performance of <inline-formula><tex-math notation="LaTeX">${{\bf Ge}}/{{\bf G}}{{{\bf e}}_{1 - {\boldsymbol{x}}}}{{\bf S}}{{{\bf n}}_{\boldsymbol{x}}}/{{\bf Ge}}$</tex-math></inline-formula> Heterojunction Phototransistors

    Impact of Temperature and Doping on the Performance of <inline-formula><tex-math notation="LaTeX">${{\bf Ge}}/{{\bf G}}{{{\bf e}}_{1 - {\boldsymbol{x}}}}{{\bf S}}{{{\bf n}}_{\bolds... by Harshvardhan Kumar, Rikmantra Basu, Guo-En Chang

    Published 2020-01-01
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