Twinning mediated intralayer frustration governs structural degradation in layered Li-rich oxide cathode by Tingting Yang, Maolin Yang, Zhongyuan Huang, Rui Wang, Wenhai Ji, Peng-Han Lu, Tao Zeng, Zenan Li, Jun Wang, Rafal E. Dunin-Borkowski, Lei Jin, Yinguo Xiao

Get full text