Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering by Hiroo Tajiri, Shinji Kohara, Koji Kimura, Sekhar Halubai, Haruto Morimoto, Naohisa Happo, Jens R. Stellhorn, Yohei Onodera, Xvsheng Qiao, Daisuke Urushihara, Peidong Hu, Toru Wakihara, Toyohiko Kinoshita, Koichi Hayashi

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