Low-Frequency Admittance of Capacitor with Working Substance “Insulator–Partially Disordered Semiconductor– Insulator” by N. A. Poklonski, I. I. Anikeev, S. A. Vyrko

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High-Frequency Capacitor with Working Substance "Insulator-Undoped Silicon-Insulator" by N. A. Poklonski, I. I. Anikeev, S. A. Vyrko

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CALCULATION OF STATIC PARAMETERS OF SILICON DIODE CONTAINING δ-LAYER OF TRIPLE-CHARGED POINT DEFECTS IN SYMMETRIC p–n-JUNCTION by N. A. Poklonski, A. I. Kovalev, N. I. Gorbachuk, S. V. Shpakovski

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Model of Electromagnetic Emitter Based on a Stream of Single Electrons inside Curved Carbon Nanotube by N. A. Poklonski, S. A. Vyrko, A. T. Vlassov, A. I. Siahlo, S. V. Ratkevich

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Model of Field Electron Emission from the Edge of Flat Graphene into Vacuum by N. A. Poklonski, A. I. Siahlo, S. A. Vyrko, S. V. Ratkevich, A. T. Vlassov

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TECHNIQUE OF ESTIMATE OF CONDUCTIVITY OF SMALL COAL SAMPLES BY THEIR INFLUENCE ON SIGNAL OF SPIN-LABEL IN RESONATOR OF ESR SPECTROMETER by N. A. Poklonski, S. A. Vyrko, O. N. Poklonskaya, N. I. Gorbachuk, A. I. Siahlo

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FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES by N. A. Poklonski, A. I. Siahlo, V. T. Shnitko, V. A. Merkulov, O. M. Davidenia, A. I. Kovalev

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