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    Surface properties of MOCVD grown (Al1−xGax)2O3 thin films on c-plane sapphire via scanning Kelvin probe microscopy

    Surface properties of MOCVD grown (Al1−xGax)2O3 thin films on c-plane sapphire via scanning Kelvin probe microscopy by Mohi Uddin Jewel, Scott R. Crittenden, Tahir Hassan, Samiul Hasan, Dongkyu Lee, Nifat Jahan Nipa, Md. Ghulam Zakir, Mohammad Jamal El Loubani, Vitaliy Avrutin, Ümit Özgür, Hadis Morkoç, Iftikhar Ahmad

    Published 2024-12-01
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