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A novel Compound-Pareto model with applications and reliability peaks above a random threshold value at risk analysis by Mohammad Abiad, M. M. Abd El-Raouf, Haitham M. Yousof, M. E. Bakr, Oluwafemi Samson Balogun, M. Yusuf, Getachew Tekle Mekiso, Yusra A. Tashkandy
Published 2025-07-01Get full text
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