Characterizing sample degradation from synchrotron based X-ray measurements of ultra-thin exfoliated flakes by M. F. DiScala, V. Hsieh, B. S. Jessen, Y. Gu, D. J. Rizzo, J. M. Amontree, X. Yan, Q. Wang, M. Kapfer, T. Kim, M. Geiwitz, G. Natale, J. Pelliciari, J. C. Hone, K. S. Burch, D. N. Basov, C. R. Dean, V. Bisogni, K. W. Plumb

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