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    Store Separation: Photogrammetric Solution for the Static Ejection Test

    Store Separation: Photogrammetric Solution for the Static Ejection Test by Luiz Eduardo Guarino de Vasconcelos, Nelson Paiva Oliveira Leite, André Yoshimi Kusumoto, Leandro Roberto, Cristina Moniz Araujo Lopes

    Published 2019-01-01
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