Understanding Frequency Dependence of Trap Generation Under AC Positive Bias Temperature Instability Stress in Si n-FinFETs by Yunfei Shi, Hao Chang, Hong Yang, Qiangzhu Zhang, Qianqian Liu, Bo Tang, Longda Zhou, Zhigang Ji, Junjie Li, Xiaobin He, Junfeng Li, Huaxiang Yin, Xiaolei Wang, Jun Luo, Wenwu Wang

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