High-fidelity sub-microsecond single-shot electron spin readout above 3.5 K by H. Geng, M. Kiczynski, A. V. Timofeev, E. N. Osika, D. Keith, J. Rowlands, L. Kranz, R. Rahman, Y. Chung, J. G. Keizer, S. K. Gorman, M. Y. Simmons

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