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    Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology

    Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology by Bojan Cavrić, Edin Dolićanin, Predrag Petronijević, Milić Pejović, Koviljka Stanković

    Published 2013-01-01
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    Damage Induced by Neutron Radiation on Output Characteristics of Solar Cells, Photodiodes, and Phototransistors

    Damage Induced by Neutron Radiation on Output Characteristics of Solar Cells, Photodiodes, and Phototransistors by Biljana Simić, Dejan Nikolić, Koviljka Stanković, Ljubinko Timotijević, Srboljub Stanković

    Published 2013-01-01
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