Showing 1 - 2 results of 2 for search 'Kham M. Niang', query time: 0.01s Refine Results
  1. 1
    Atomic layer deposited Ta2O5: From process optimization to thin film characterization

    Atomic layer deposited Ta2O5: From process optimization to thin film characterization by Xiao Chen, Kham M. Niang, Babak Bakhit, Yuri Jeon, Judith Driscoll, Andrew Flewitt

    Published 2025-04-01
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  2. 2
    Defect Density of States of Tin Oxide and Copper Oxide p‐type Thin‐film Transistors

    Defect Density of States of Tin Oxide and Copper Oxide p‐type Thin‐film Transistors by Måns J. Mattsson, Kham M. Niang, Jared Parker, David J. Meeth, John F. Wager, Andrew J. Flewitt, Matt W. Graham

    Published 2025-07-01
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