Surface polarization profile of ferroelectric thin films probed by X-ray standing waves and photoelectron spectroscopy by Le Phuong Hoang, Irena Spasojevic, Tien-Lin Lee, David Pesquera, Kai Rossnagel, Jörg Zegenhagen, Gustau Catalan, Ivan A. Vartanyants, Andreas Scherz, Giuseppe Mercurio

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