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    Multi-stage deep learning artifact reduction for parallel-beam computed tomography

    Multi-stage deep learning artifact reduction for parallel-beam computed tomography by Jiayang Shi, Daniël M. Pelt, K. Joost Batenburg

    Published 2025-03-01
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  2. 2
    A Comparative Study of Supervised and Self-Supervised Denoising Techniques for Defect Segmentation in Industrial CT Imaging

    A Comparative Study of Supervised and Self-Supervised Denoising Techniques for Defect Segmentation in Industrial CT Imaging by Virginia Florian, Jiayang Shi, Willem Jan Palestijn, Daniël M. Pelt, K. Joost Batenburg, Thomas Lang, Christoph Heinzl, Christian Kretzer, Stefan Kasperl, Dominik Wolfschläger, Robert H. Schmitt

    Published 2025-02-01
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