Showing 1 - 2 results of 2 for search 'Junkang Li', query time: 0.01s Refine Results
  1. 1
    The Response Frequency of Interface Traps Using a Dual-Frequency Charge-Pumping Method and Its Correlation With 1<italic>/f</italic> Noise

    The Response Frequency of Interface Traps Using a Dual-Frequency Charge-Pumping Method and Its Correlation With 1<italic>/f</italic> Noise by Yi Jiang, Luping Wang, Kai Chen, Rui Su, Luyu Yang, Dawei Gao, Junkang Li, Ran Cheng, Rui Zhang

    Published 2025-01-01
    Get full text
    Article
    Save to List
    Saved in:
  2. 2
    Impact of the Schottky Barrier Height on the Carrier Velocity Overshoot Behaviors in SOI nMOSFETs With Metal Source/Drain

    Impact of the Schottky Barrier Height on the Carrier Velocity Overshoot Behaviors in SOI nMOSFETs With Metal Source/Drain by Rui Su, Yan Jing, Xinyi Zhang, Yi Jiang, Dawei Gao, Walter Schwarzenbach, Bich-Yen Nguyen, Junkang Li, John Robertson, Rui Zhang

    Published 2025-01-01
    Get full text
    Article
    Save to List
    Saved in:

Search Tools: