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    Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84 Multiple Quantum Wells on Ge Virtual Substrate

    Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84 Multiple Quantum Wells on Ge Virtual Substrate by Hung-Pin Hsu, Pong-Hong Yang, Jeng-Kuang Huang, Po-Hung Wu, Ying-Sheng Huang, Cheng Li, Shi-Hao Huang, Kwong-Kau Tiong

    Published 2013-01-01
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