Low-frequency noise analysis on asymmetric damage and self-recovery behaviors of ZnSnO thin-film transistors under hot carrier stress by Wonjun Shin, Ji Ye Lee, Jangsaeng Kim, Sang Yeol Lee, Sung-Tae Lee

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Effects of Charge Imbalance on Field‐Induced Instability of HfO2‐Based Ferroelectric Tunnel Junctions by Wonjun Shin, Chang‐Hyeon Han, Jangsaeng Kim, Ryun‐Han Koo, Kyung Kyu Min, Daewoong Kwon

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All‐Ferroelectric Spiking Neural Networks via Morphotropic Phase Boundary Neurons by Jangsaeng Kim, Eun Chan Park, Wonjun Shin, Ryun‐Han Koo, Jiseong Im, Chang‐Hyeon Han, Jong‐Ho Lee, Daewoong Kwon

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Ferroelectric NAND for efficient hardware bayesian neural networks by Minsuk Song, Ryun-Han Koo, Jangsaeng Kim, Chang-Hyeon Han, Jiyong Yim, Jonghyun Ko, Sijung Yoo, Duk-hyun Choe, Sangwook Kim, Wonjun Shin, Daewoong Kwon

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Low‐Frequency Noise Spectroscopy for Navigating Geometrically Varying Strain Effects in HfO2 Ferroelectric FETs by Ryun‐Han Koo, Wonjun Shin, Sangwoo Kim, Jangsaeng Kim, Been Kwak, Jiseong Im, Hyunwoo Kim, Deok‐Hwang Kwon, Suraj S. Cheema, Jong‐Ho Lee, Daewoong Kwon

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Multifunctional In‐Memory Analog‐to‐Digital Converter for Next‐Gen Compute‐in‐Memory Systems by Jiseong Im, Jonghyun Ko, Joon Hwang, Jangsaeng Kim, Wonjun Shin, Ryun‐Han Koo, Minkyu Park, Sung‐Ho Park, Woo Young Choi, Jae‐Joon Kim, Jong‐Ho Lee

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