Correcting for focal spot drift in edge illumination X-ray phase contrast imaging by Nicholas Francken, Jonathan Sanctorum, Ben Huyge, Jan Sijbers, Jan De Beenhouwer

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Proximal Neural Networks based reconstruction for few-view CT applications by Hoang Trieu Vy Le, Caroline Bossuyt, Julie Escoda, Marius Costin, Jan De Beenhouwer, Jan Sijbers

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In-depth imaging of in-vitro tissue models using electrical impedance tomography by Jian Deng, Babu Linkoon P Meenaketan, Saeedeh Ebrahimi Takalloo, Yoke Chin Cha, Tom Torfs, Dries Braeken, Jan De Beenhouwer, Jan Sijbers

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