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Surface Recombination Via Interface Defects in Field Effect Transistors by E. Bendada, K. Raïs, P. Mialhe, J. P. Charles
Published 1998-01-01
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Analysis and Simulation of Functional Stress Degradation on VDOMS Power Transistors by M. Zoaeter, B. Beydoun, M. Hajjar, M. Debs, J-P Charles
Published 2002-01-01
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