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    Correction: AFM-IR investigation of thin PECVD SiOx films on a polypropylene substrate in the surface-sensitive mode

    Correction: AFM-IR investigation of thin PECVD SiOx films on a polypropylene substrate in the surface-sensitive mode by Hendrik Müller, Hartmut Stadler, Teresa de los Arcos, Adrian Keller, Guido Grundmeier

    Published 2025-02-01
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