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    Impact of neutron radiation induced defects on the surge current robustness of silicon carbide P‐intrinsic‐N diodes

    Impact of neutron radiation induced defects on the surge current robustness of silicon carbide P‐intrinsic‐N diodes by Haoshu Tan, Lin Zhang, Zhiqiang Li, Jun Tao Li, Peng Dong

    Published 2025-02-01
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