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Generalized Method to Extract Carrier Diffusion Length from Photoconductivity Transients: Cases of BiVO_{4}, Halide Perovskites, and Amorphous and Crystalline Silicon by Markus Schleuning, Moritz Kölbach, Fatwa F. Abdi, Klaus Schwarzburg, Martin Stolterfoht, Rainer Eichberger, Roel van de Krol, Dennis Friedrich, Hannes Hempel
Published 2022-09-01Get full text
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