Showing 1 - 1 results of 1 for search 'Guy Van Orden', query time: 0.01s Refine Results
  1. 1
    On the Structure of Measurement Noise in Eye-Tracking

    On the Structure of Measurement Noise in Eye-Tracking by Charles A. Coey, Sebastian Wallot, Michael J. Richardson, Guy Van Orden

    Published 2012-09-01
    Get full text
    Article
    Save to List
    Saved in:

Search Tools: