Ge/Si Quantum Dots Superlattices Grown at Different Temperatures and Characterized by Raman Spectroscopy and Capacitance Measurements by A. D. Rodrigues, A. J. Chiquito, G. Zanelatto, A. G. Milekhin, A. I. Nikiforov, V. V. Ulyanov, O. P. Pchelyakov, D. R. T. Zahn, J. C. Galzerani

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