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Defect concentration in clusters, created by fast-pile neutrons in n-Si (FZ, Cz) by A. P. Dolgolenko, G. P. Gaidar, P. G. Litovchenko
Published 2007-12-01Get full text
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Radiation hardness of silicon doped by germanium with high concentration of free oxygen by M. D. Varentsov, G. P. Gaidar, A. P. Dolgolenko, P. G. Litovchenko
Published 2006-06-01Get full text
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