Showing 1 - 5 results of 5 for search 'E. Bendada', query time: 0.02s Refine Results
  1. 1
    Analysis of Hot-Carrier Degradation in Small and Large W/L n-Channel Transistors

    Analysis of Hot-Carrier Degradation in Small and Large W/L n-Channel Transistors by E. Bendada, K. Raïs

    Published 1998-01-01
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  2. 2
    Surface Recombination Via Interface Defects in Field Effect Transistors

    Surface Recombination Via Interface Defects in Field Effect Transistors by E. Bendada, K. Raïs, P. Mialhe, J. P. Charles

    Published 1998-01-01
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  3. 3
    Relaxable Damage in Hot-Carrier Stressing of n-MOS Transistors

    Relaxable Damage in Hot-Carrier Stressing of n-MOS Transistors by M. Rahmoun, E. Bendada, A. El Hassani, K. Raïs

    Published 2000-01-01
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  4. 4
    New Method for Determination of Drain Saturation Voltage in Short Channel MOS Devices Between Liquid Helium to Room Temperature

    New Method for Determination of Drain Saturation Voltage in Short Channel MOS Devices Between Liquid Helium to Room Temperature by Y. Amhouche, A. El Abbassi, K. Raïs, E. Bendada, R. Rmaily

    Published 2001-01-01
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  5. 5
    Characterization of Series Resistances and Mobility Attenuation Phenomena in Short Channel MOS Transistors

    Characterization of Series Resistances and Mobility Attenuation Phenomena in Short Channel MOS Transistors by A. El Abbassi, Y. Amhouche, E. Bendada, R. Rmaily, K. Raïs

    Published 2001-01-01
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