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  1. 1
    Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques

    Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques by Alexandre Pereira, Simon Spindler, Zhitian Shi, Lucia Romano, Michał Rawlik, Federica Marone, Daniel Josell, Martin Stauber, Marco Stampanoni

    Published 2025-04-01
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  2. 2
    Fabrication of Ultra‐Thick Masks for X‐Ray Phase Contrast Imaging at Higher Energy

    Fabrication of Ultra‐Thick Masks for X‐Ray Phase Contrast Imaging at Higher Energy by Alessandro Rossi, Ian Buchanan, Alberto Astolfo, Martyna Michalska, Daniel Briglin, Anton Charman, Daniel Josell, Alessandro Olivo, Ioannis Papakonstantinou

    Published 2025-04-01
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