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    Investigation of Modal Characteristics of Silicon Nitride Ridge Waveguides for Enhanced Refractive Index Sensing

    Investigation of Modal Characteristics of Silicon Nitride Ridge Waveguides for Enhanced Refractive Index Sensing by Muhammad A. Butt, Lukasz Kozlowski, Mateusz Słowikowski, Marcin Juchniewicz, Dagmara Drecka, Maciej Filipiak, Michał Golas, Bartłomiej Stonio, Michal Dudek, Ryszard Piramidowicz

    Published 2025-01-01
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