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  1. 1
    A New Analytical Expression for the T.C.R. of Thin Monocrystalline Metal Films

    A New Analytical Expression for the T.C.R. of Thin Monocrystalline Metal Films by C. R. Tellier

    Published 1979-01-01
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  2. 2
    Grain Size Dependence of the Gauge Factor of Thin Metallic Films

    Grain Size Dependence of the Gauge Factor of Thin Metallic Films by A. J. Tosser, C. R. Tellier

    Published 1977-01-01
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  3. 3
    Comments on Size Effects in Metallic Films

    Comments on Size Effects in Metallic Films by A. J. Tosser, C. R. Tellier

    Published 1980-01-01
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  4. 4
    Resistivity Recovery of Thin Sputtered Aluminium Films

    Resistivity Recovery of Thin Sputtered Aluminium Films by C. R. Tellier, A. J. Tosser

    Published 1976-01-01
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  5. 5
    Chemical Etching of {hk0} Silicon Plates in EDP Part I: Experiments and Comparison with TMAH

    Chemical Etching of {hk0} Silicon Plates in EDP Part I: Experiments and Comparison with TMAH by C. R. Tellier, T. G. Leblois, A. Charbonnieras

    Published 2000-01-01
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  6. 6
    Physical Basis of Warkusz's Equation for Polycrystalline Metallic Conductivity

    Physical Basis of Warkusz's Equation for Polycrystalline Metallic Conductivity by C. R. Tellier, A. J. Tosser, C. R. Pichard

    Published 1980-01-01
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  7. 7
    Size Effects in the Thermal Variations of the Hall Coefficient

    Size Effects in the Thermal Variations of the Hall Coefficient by A. J. Tosser, C. R. Tellier, C. R. Pichard

    Published 1981-01-01
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  8. 8
    Three Dimensional Analytical Separation of Grain Boundary and Surface Scatterings in Polycrystalline Metal Films in the Case of Non Cubic Grains

    Three Dimensional Analytical Separation of Grain Boundary and Surface Scatterings in Polycrystalline Metal Films in the Case of Non Cubic Grains by C. R. Pichard, A. J. Tosser, C. R. Tellier

    Published 1981-01-01
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