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  1. 1
    ARIA: Additive ReRAM-Based Integrity and Aging Monitoring for ICs

    ARIA: Additive ReRAM-Based Integrity and Aging Monitoring for ICs by Thomas Schultz, Rashmi Jha, Brian Dupaix, Matt Casto

    Published 2025-01-01
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  2. 2
    In Situ Time-Based Sensor for Process Identification Using Amplified Back-End-of-Line Resistance and Capacitance

    In Situ Time-Based Sensor for Process Identification Using Amplified Back-End-of-Line Resistance and Capacitance by Jen-Chieh Hsueh, Mike Kines, Yousri Ahmed Tantawy, Dale Shane Smith, Jamin McCue, Brian Dupaix, Vipul J. Patel, Waleed Khalil

    Published 2025-05-01
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