Rapid estimation of DON content in wheat flour using close‐range hyperspectral imaging and machine learning by Dinesh Kumar Saini, Anshul Rana, Jyotirmoy Halder, Mohammad Maruf Billah, Harsimardeep S. Gill, Jinfeng Zhang, Subash Thapa, Shaukat Ali, Brent Turnipseed, Karl Glover, Maitiniyazi Maimaitijiang, Sunish K. Sehgal

Get full text