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    A Split Island Layout Style of Butting/Inserted Substrate Pickups for NMOSFET ESD Reliability

    A Split Island Layout Style of Butting/Inserted Substrate Pickups for NMOSFET ESD Reliability by Chih-Yao Huang, Fu-Chien Chiu, Bo-Chen Lin, Po-Kung Song

    Published 2015-01-01
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