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  1. 1
    A Multi-Machine and Multi-Modal Drift Detection (M2D2) Framework for Semiconductor Manufacturing

    A Multi-Machine and Multi-Modal Drift Detection (M2D2) Framework for Semiconductor Manufacturing by Chin-Yi Lin, Tzu-Liang (Bill) Tseng, Tsung-Han Tsai

    Published 2025-06-01
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  2. 2
    Methodology for Enablement of Human Digital Twins for Quality Assurance in the Aerospace Manufacturing Domain

    Methodology for Enablement of Human Digital Twins for Quality Assurance in the Aerospace Manufacturing Domain by Christopher Lee Colaw, Garrett Madison, Bill Tseng, Grayson Michael Griser, Gage Truelson, Adam Gallo, Yildirim Hurmuzlu

    Published 2025-05-01
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