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    Low‐Frequency Noise Spectroscopy for Navigating Geometrically Varying Strain Effects in HfO2 Ferroelectric FETs

    Low‐Frequency Noise Spectroscopy for Navigating Geometrically Varying Strain Effects in HfO2 Ferroelectric FETs by Ryun‐Han Koo, Wonjun Shin, Sangwoo Kim, Jangsaeng Kim, Been Kwak, Jiseong Im, Hyunwoo Kim, Deok‐Hwang Kwon, Suraj S. Cheema, Jong‐Ho Lee, Daewoong Kwon

    Published 2025-06-01
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